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Predicting Shot-Level SRAM Read/Write Margin Based on Measu..:

Bin, Shu-Yung ; Lin, Shih-Feng ; Cheng, Ya-Ching...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  24 (2016)  2 - p. 625-637 , 2016
Link: https://doi.org/10.1109/tvlsi.2015.2418998