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Design-Time Reliability Enhancement Using Hotspot Identific..:

Chang, Doohwang ; Kitchen, Jennifer N. ; Bakkaloglu, Bertan..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  24 (2016)  3 - p. 1179-1183 , 2016
Link: https://doi.org/10.1109/tvlsi.2015.2428221