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Built-In Self-Test and Digital Calibration of Zero-IF RF Tr..:

Jeong, Jae Woong ; Nassery, Afsaneh ; Kitchen, Jennifer N..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  24 (2016)  6 - p. 2286-2298 , 2016
Link: https://doi.org/10.1109/tvlsi.2015.2506547