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Built-In Self-Test Methodology With Statistical Analysis fo..:

Kim, Woongrae ; Chen, Chang-Chih ; Kim, Dae-Hyun.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  24 (2016)  7 - p. 2521-2534 , 2016
Link: https://doi.org/10.1109/tvlsi.2015.2513369