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1 Ergebnisse
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Bias-Induced Healing of $V_{\text {min}}$ Failures in Advan..:
Mann, Randy W.
;
McMahon, William
;
Mamy Randriamihaja, Yoann
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25 (2017) 2 - p. 660-669 , 2017
Link:
https://doi.org/10.1109/tvlsi.2016.2598160
RT Journal T1
Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2016.2598160&Exemplar=1&LAN=DE A1 Mann, Randy W. A1 McMahon, William A1 Mamy Randriamihaja, Yoann A1 Song, Yuncheng A1 Kallianpur, Ajay Anand A1 Xie, Sheng A1 Gautam, Akhilesh A1 Versaggi, Joseph A1 Parameshwaran, Biju A1 Weintraub, Chad E. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2017 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 25 IS 2 SP 660 OP 669 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2016.2598160 DO https://doi.org/10.1109/tvlsi.2016.2598160 SF ELIB - SuUB Bremen
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