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Bias-Induced Healing of $V_{\text {min}}$ Failures in Advan..:

Mann, Randy W. ; McMahon, William ; Mamy Randriamihaja, Yoann...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  2 - p. 660-669 , 2017
Link: https://doi.org/10.1109/tvlsi.2016.2598160