I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Low-Power Scan-Based Built-In Self-Test Based on Weighted P..:

Xiang, Dong ; Wen, Xiaoqing ; Wang, Laung-Terng
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  3 - p. 942-953 , 2017
Link: https://doi.org/10.1109/tvlsi.2016.2606248