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Dynamic Diagnosis for Defective Reconfigurable Single-Elect..:

Li, Yun-Jui ; Huang, Ching-Yi ; Wu, Chia-Cheng...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  25 (2017)  4 - p. 1477-1489 , 2017
Link: https://doi.org/10.1109/tvlsi.2016.2639533