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A Dual-Data Line Read Scheme for High-Speed Low-Energy Resi..:

Lee, Albert ; Lee, Hochul ; Ebrahimi, Farbod...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  26 (2018)  2 - p. 272-279 , 2018
Link: https://doi.org/10.1109/tvlsi.2017.2766150