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Reliability-Aware Test Methodology for Detecting Short-Chan..:

Bhowmik, Biswajit ; Biswas, Santosh ; Deka, Jatindra Kumar.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  26 (2018)  6 - p. 1026-1039 , 2018
Link: https://doi.org/10.1109/tvlsi.2018.2803478