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Reducing Rollback Cost in VLSI Circuits to Improve Fault To..:

Bonnoit, Thierry ; Zergainoh, Nacer-Eddine ; Nicolaidis, Michael
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  26 (2018)  8 - p. 1438-1451 , 2018
Link: https://doi.org/10.1109/tvlsi.2018.2818021