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1 Ergebnisse
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A Simplified Yield Model for SRAM Repair in Advanced Techno..:
Qi, Xiaoyuan
;
Rosner, Raymond J.
;
Hopkins, John
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 26 (2018) 11 - p. 2494-2503 , 2018
Link:
https://doi.org/10.1109/tvlsi.2018.2858561
RT Journal T1 <Title>A Simplified Yield Model for SRAM Repair in Advanced Technology</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2018.2858561&Exemplar=1&LAN=DE A1 Qi, Xiaoyuan A1 Rosner, Raymond J. A1 Hopkins, John A1 Higman, Jack M. A1 Mewhirter, Rick A1 Sinnott, Aaron A1 Nair, Binod Kumar G. A1 Ahsan, Ishtiaq A1 Lagus, Mark PB Institute of Electrical and Electronics Engineers (IEEE) YR 2018 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 26 IS 11 SP 2494 OP 2503 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2018.2858561 DO https://doi.org/10.1109/tvlsi.2018.2858561 SF ELIB - SuUB Bremen
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