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High-Volume Testing and DC Offset Trimming Technique of On-..:

Oshita, Takao ; Douglas, Jonathan ; Krishnamoorthy, Arun
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  27 (2019)  4 - p. 821-829 , 2019
Link: https://doi.org/10.1109/tvlsi.2018.2882567