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A Comprehensive Framework for Parametric Failure Modeling a..:

Nair, Sarath Mohanachandran ; Bishnoi, Rajendra ; Tahoori, Mehdi B.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  27 (2019)  7 - p. 1697-1710 , 2019
Link: https://doi.org/10.1109/tvlsi.2019.2904197