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1 Ergebnisse
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An Extrinsic Device and Leakage Mechanism in Advanced Bulk ..:
Mann, Randy W.
;
Zhao, Meixiong
;
Parihar, Sanjay
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 27 (2019) 8 - p. 1819-1827 , 2019
Link:
https://doi.org/10.1109/tvlsi.2019.2907594
RT Journal T1 <Title>An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2019.2907594&Exemplar=1&LAN=DE A1 Mann, Randy W. A1 Zhao, Meixiong A1 Parihar, Sanjay A1 Gao, Qun A1 Arya, Ankur A1 Radens, Carl A1 Pandey, Shesh Mani A1 Versaggi, Joseph A1 Higman, Jack M. A1 Carter, Rick PB Institute of Electrical and Electronics Engineers (IEEE) YR 2019 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 27 IS 8 SP 1819 OP 1827 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2019.2907594 DO https://doi.org/10.1109/tvlsi.2019.2907594 SF ELIB - SuUB Bremen
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