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SRAM Stability Analysis and Performance–Reliability Tradeof..:

Zhang, Rui ; Liu, Taizhi ; Yang, Kexin..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  28 (2020)  3 - p. 620-633 , 2020
Link: https://doi.org/10.1109/tvlsi.2019.2956923