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On-Chip Thermal Profiling to Detect Malicious Activity: Sys..:

Yan, Mengting ; Wei, Haoran ; Onabajo, Marvin
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  29 (2021)  3 - p. 530-543 , 2021
Link: https://doi.org/10.1109/tvlsi.2020.3047020