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A Back-Sampling Chain Technique for Accelerated Detection, ..:
Kumar, Saurabh
;
Cho, Minki
;
Everson, Luke R.
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 29 (2021) 12 - p. 2086-2097 , 2021
Link:
https://doi.org/10.1109/tvlsi.2021.3119462
RT Journal T1 <Title>A Back-Sampling Chain Technique for Accelerated Detection, Characterization, and Reconstruction of Radiation-Induced Transient Pulses</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2021.3119462&Exemplar=1&LAN=DE A1 Kumar, Saurabh A1 Cho, Minki A1 Everson, Luke R. A1 Malavasi, Andres A1 Lake, Dan A1 Tokunaga, Carlos A1 Khellah, Muhammad A1 Tschanz, James W. A1 De, Vivek A1 Kim, Chris H. PB Institute of Electrical and Electronics Engineers (IEEE) YR 2021 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 29 IS 12 SP 2086 OP 2097 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2021.3119462 DO https://doi.org/10.1109/tvlsi.2021.3119462 SF ELIB - SuUB Bremen
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