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Test Methodology for Defect-Based Bridge Faults:

Chang, Shuo-Wen ; Nien, Yu-Teng ; Hu, Yu-Pang...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  30 (2022)  7 - p. 975-988 , 2022
Link: https://doi.org/10.1109/tvlsi.2022.3154535