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Evaluation of Nanosheet and Forksheet Width Modulation for ..:
Sisto, Giuliano
;
Zografos, Odysseas
;
Chehab, Bilal
...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 30 (2022) 10 - p. 1497-1506 , 2022
Link:
https://doi.org/10.1109/tvlsi.2022.3190080
RT Journal T1 <Title>Evaluation of Nanosheet and Forksheet Width Modulation for Digital IC Design in the Sub-3-nm Era</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2022.3190080&Exemplar=1&LAN=DE A1 Sisto, Giuliano A1 Zografos, Odysseas A1 Chehab, Bilal A1 Kakarla, Naveen A1 Xiang, Yang A1 Milojevic, Dragomir A1 Weckx, Pieter A1 Hellings, Geert A1 Ryckaert, Julien PB Institute of Electrical and Electronics Engineers (IEEE) YR 2022 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 30 IS 10 SP 1497 OP 1506 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2022.3190080 DO https://doi.org/10.1109/tvlsi.2022.3190080 SF ELIB - SuUB Bremen
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