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Reliability Evaluation and Fault Tolerance Design for FPGA ..:

Gao, Zhen ; Shi, Jinchang ; Liu, Qiang..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  1 - p. 142-146 , 2023
Link: https://doi.org/10.1109/tvlsi.2022.3224137