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1 Ergebnisse
1
Eliminating Minimum Implant Area Violations With Design Qua..:
Jeong, Eunsol
;
Kim, Taewhan
;
Park, Heechun
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 31 (2023) 5 - p. 611-621 , 2023
Link:
https://doi.org/10.1109/tvlsi.2022.3225551
RT Journal T1
Eliminating Minimum Implant Area Violations With Design Quality Preservation
UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2022.3225551&Exemplar=1&LAN=DE A1 Jeong, Eunsol A1 Kim, Taewhan A1 Park, Heechun PB Institute of Electrical and Electronics Engineers (IEEE) YR 2023 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 31 IS 5 SP 611 OP 621 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2022.3225551 DO https://doi.org/10.1109/tvlsi.2022.3225551 SF ELIB - SuUB Bremen
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