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Built-In Self-Test of High-Density and Realistic ILV Layout..:

Chaudhuri, Arjun ; Banerjee, Sanmitra ; Kim, Jinwoo..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  3 - p. 296-309 , 2023
Link: https://doi.org/10.1109/tvlsi.2022.3228850