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Page Type-Aware Data Migration Technique for Read Disturb M..:

Han, Sangwoo ; Cho, Minjung ; Lee, Gi.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  4 - p. 591-595 , 2023
Link: https://doi.org/10.1109/tvlsi.2023.3240172