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Edge Word-Line Reliability Problem in 3-D NAND Flash Memory..:

Wei, Debao ; Feng, Hua ; Liu, Ming...
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  6 - p. 861-873 , 2023
Link: https://doi.org/10.1109/tvlsi.2023.3249183