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Automated In-Situ Monitoring for Variability-Resilient and ..:

Nieto Taladriz, Clara ; Dehaene, Wim
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  31 (2023)  9 - p. 1320-1329 , 2023
Link: https://doi.org/10.1109/tvlsi.2023.3282678