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1 Ergebnisse
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RA-Aware Fail Data Collection Architecture for Cost Reducti..:
Lee, Hayoung
;
Lee, Sooryeong
;
Kang, Sungho
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 32 (2024) 6 - p. 1136-1149 , 2024
Link:
https://doi.org/10.1109/tvlsi.2023.3343369
RT Journal T1 <Title>RA-Aware Fail Data Collection Architecture for Cost Reduction</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1109_tvlsi.2023.3343369&Exemplar=1&LAN=DE A1 Lee, Hayoung A1 Lee, Sooryeong A1 Kang, Sungho PB Institute of Electrical and Electronics Engineers (IEEE) YR 2024 SN 1063-8210 SN 1557-9999 JF IEEE Transactions on Very Large Scale Integration (VLSI) Systems VO 32 IS 6 SP 1136 OP 1149 LK http://dx.doi.org/https://doi.org/10.1109/tvlsi.2023.3343369 DO https://doi.org/10.1109/tvlsi.2023.3343369 SF ELIB - SuUB Bremen
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