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Analyzing the Vulnerabilities of External SDRAM on System-o..:

Proulx, Alexandre ; Chouinard, Jean-Yves ; Miled, Amine.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  6 - p. 1124-1135 , 2024
Link: https://doi.org/10.1109/tvlsi.2024.3360370