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Rowhammer Vulnerability of DRAMs in 3-D Integration:

Ortega, Eduardo ; Talukdar, Jonti ; Paik, Woohyun..
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  5 - p. 967-971 , 2024
Link: https://doi.org/10.1109/tvlsi.2024.3368044