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Fault Diagnosis for Resistive Random Access Memory and Mono..:

Hung, Shao-Chun ; Chaudhuri, Arjun ; Banerjee, Sanmitra.
IEEE Transactions on Very Large Scale Integration (VLSI) Systems.  32 (2024)  7 - p. 1336-1349 , 2024
Link: https://doi.org/10.1109/tvlsi.2024.3380549