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Commentary on: Liu Y, Attinger D, De Brabanter K. Automatic..:
Keten, Alper
Journal of Forensic Sciences. 65 (2020) 4 - p. 1385-1385 , 2020
Link:
https://doi.org/10.1111/1556-4029.14449
RT Journal T1 <Title>Commentary on: Liu Y, Attinger D, De Brabanter K. Automatic classification of bloodstain patterns caused by gunshot and blunt impact at various distances. J Forensic Sci. doi: 10.1111/1556‐4029.14262. Epub 2020 Jan 16</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1111_1556-4029.14449&Exemplar=1&LAN=DE A1 Keten, Alper PB Wiley YR 2020 SN 0022-1198 SN 1556-4029 JF Journal of Forensic Sciences VO 65 IS 4 SP 1385 OP 1385 LK http://dx.doi.org/https://doi.org/10.1111/1556-4029.14449 DO https://doi.org/10.1111/1556-4029.14449 SF ELIB - SuUB Bremen
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