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U.S. Patent Litigation: International Aspects and Key Devel..:
Davidow, Joel
The Journal of World Intellectual Property. 2 (1999) 4 - p. 475-494 , 1999
Link:
https://doi.org/10.1111/j.1747-1796.1999.tb00073.x
RT Journal T1 <Title>U.S. Patent Litigation: International Aspects and Key Developments</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1111_j.1747-1796.1999.tb00073.x&Exemplar=1&LAN=DE A1 Davidow, Joel PB Wiley YR 1999 SN 1422-2213 SN 1747-1796 JF The Journal of World Intellectual Property VO 2 IS 4 SP 475 OP 494 LK http://dx.doi.org/https://doi.org/10.1111/j.1747-1796.1999.tb00073.x DO https://doi.org/10.1111/j.1747-1796.1999.tb00073.x SF ELIB - SuUB Bremen
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