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Structure and defect analysis of different polysilazane‐der..:
Shuster, Seth
;
Bamonte, Scott
;
Valus, Joseph
...
Journal of the American Ceramic Society. 107 (2024) 6 - p. 4296-4306 , 2024
Link:
https://doi.org/10.1111/jace.19703
RT Journal T1 <Title>Structure and defect analysis of different polysilazane‐derived silicon carbide systems</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1111_jace.19703&Exemplar=1&LAN=DE A1 Shuster, Seth A1 Bamonte, Scott A1 Valus, Joseph A1 Purgay, Ryan A1 Arif, Fayaz A1 March, Seth A1 Suib, Steven L. PB Wiley YR 2024 SN 0002-7820 SN 1551-2916 JF Journal of the American Ceramic Society VO 107 IS 6 SP 4296 OP 4306 LK http://dx.doi.org/https://doi.org/10.1111/jace.19703 DO https://doi.org/10.1111/jace.19703 SF ELIB - SuUB Bremen
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