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Enhanced dielectric reliability in the X9R‐type Bi1/2Na1/2T..:
Lee, Ju‐Hyeon
;
Yeo, Tae‐Soo
;
Jo, Wook
Journal of the American Ceramic Society. 107 (2024) 6 - p. 4252-4262 , 2024
Link:
https://doi.org/10.1111/jace.19783
RT Journal T1 <Title>Enhanced dielectric reliability in the X9R‐type Bi1/2Na1/2TiO3‐CaZrO3 relaxor ferroelectric ceramics</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1111_jace.19783&Exemplar=1&LAN=DE A1 Lee, Ju‐Hyeon A1 Yeo, Tae‐Soo A1 Jo, Wook PB Wiley YR 2024 SN 0002-7820 SN 1551-2916 JF Journal of the American Ceramic Society VO 107 IS 6 SP 4252 OP 4262 LK http://dx.doi.org/https://doi.org/10.1111/jace.19783 DO https://doi.org/10.1111/jace.19783 SF ELIB - SuUB Bremen
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