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Displacement Talbot lithography nanopatterned microsieve ar..:

Xie, Sijia ; Schurink, Bart ; Berenschot, Erwin J. W....
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena.  34 (2016)  6 - p. 06KI02 , 2016