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1 Ergebnisse
1
Controlled crack propagation for atomic precision handling ..:
Shim, Jaewoo
;
Bae, Sang-Hoon
;
Kong, Wei
...
Science. 362 (2018) 6415 - p. 665-670 , 2018
Link:
https://doi.org/10.1126/science.aat8126
RT Journal T1
Controlled crack propagation for atomic precision handling of wafer-scale two-dimensional materials
UL https://suche.suub.uni-bremen.de/peid=cr-10.1126_science.aat8126&Exemplar=1&LAN=DE A1 Shim, Jaewoo A1 Bae, Sang-Hoon A1 Kong, Wei A1 Lee, Doyoon A1 Qiao, Kuan A1 Nezich, Daniel A1 Park, Yong Ju A1 Zhao, Ruike A1 Sundaram, Suresh A1 Li, Xin A1 Yeon, Hanwool A1 Choi, Chanyeol A1 Kum, Hyun A1 Yue, Ruoyu A1 Zhou, Guanyu A1 Ou, Yunbo A1 Lee, Kyusang A1 Moodera, Jagadeesh A1 Zhao, Xuanhe A1 Ahn, Jong-Hyun A1 Hinkle, Christopher A1 Ougazzaden, Abdallah A1 Kim, Jeehwan PB American Association for the Advancement of Science (AAAS) YR 2018 SN 0036-8075 SN 1095-9203 JF Science VO 362 IS 6415 SP 665 OP 670 LK http://dx.doi.org/https://doi.org/10.1126/science.aat8126 DO https://doi.org/10.1126/science.aat8126 SF ELIB - SuUB Bremen
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