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INFLUENCE OF CURRENT DENSITY ON THE STRUCTURE OF AMORPHOUS ..:
Baranov, E. A.
;
Nepomnyashchikh, V. A.
;
Konstantinov, V. O.
...
Journal of Applied Mechanics and Technical Physics. 64 (2023) 5 - p. 778-783 , 2023
Link:
https://doi.org/10.1134/s0021894423050061
RT Journal T1 <Title>INFLUENCE OF CURRENT DENSITY ON THE STRUCTURE OF AMORPHOUS SILICON SUBOXIDE THIN FILMS UNDER ELECTRON-BEAM ANNEALING</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s0021894423050061&Exemplar=1&LAN=DE A1 Baranov, E. A. A1 Nepomnyashchikh, V. A. A1 Konstantinov, V. O. A1 Shchukin, V. G. A1 Merkulova, I. E. A1 Zamchiy, A. O. A1 Lunev, N. A. A1 Volodin, V. A. A1 Shapovalova, A. A. PB Pleiades Publishing Ltd YR 2023 SN 0021-8944 SN 1573-8620 JF Journal of Applied Mechanics and Technical Physics VO 64 IS 5 SP 778 OP 783 LK http://dx.doi.org/https://doi.org/10.1134/s0021894423050061 DO https://doi.org/10.1134/s0021894423050061 SF ELIB - SuUB Bremen
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