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SEM Investigation of the electrical properties of silicon r..:
Brantov, S. K.
;
Feklisova, O. V.
;
Yakimov, E. B.
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 5 (2011) 5 - p. 954-957 , 2011
Link:
https://doi.org/10.1134/s1027451011100053
RT Journal T1 <Title>SEM Investigation of the electrical properties of silicon ribbons</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s1027451011100053&Exemplar=1&LAN=DE A1 Brantov, S. K. A1 Feklisova, O. V. A1 Yakimov, E. B. PB Pleiades Publishing Ltd YR 2011 SN 1027-4510 SN 1819-7094 JF Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques VO 5 IS 5 SP 954 OP 957 LK http://dx.doi.org/https://doi.org/10.1134/s1027451011100053 DO https://doi.org/10.1134/s1027451011100053 SF ELIB - SuUB Bremen
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