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1 Ergebnisse
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Combined multiparametric X-ray diffraction diagnostics of m..:
Kislovskii, E. N.
;
Molodkin, V. B.
;
Olikhovskii, S. I.
...
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 7 (2013) 3 - p. 523-530 , 2013
Link:
https://doi.org/10.1134/s1027451013030270
RT Journal T1 <Title>Combined multiparametric X-ray diffraction diagnostics of microdefects in silicon crystals after irradiation by high-energy electrons</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s1027451013030270&Exemplar=1&LAN=DE A1 Kislovskii, E. N. A1 Molodkin, V. B. A1 Olikhovskii, S. I. A1 Len, E. G. A1 Sheludchenko, B. V. A1 Lizunova, S. V. A1 Vladimirova, T. P. A1 Kochelab, E. V. A1 Reshetnyk, O. V. A1 Dovganyuk, V. V. A1 Fodchuk, I. M. A1 Lytvynchuk, T. V. A1 Klad'ko, V. P. PB Pleiades Publishing Ltd YR 2013 SN 1027-4510 SN 1819-7094 JF Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques VO 7 IS 3 SP 523 OP 530 LK http://dx.doi.org/https://doi.org/10.1134/s1027451013030270 DO https://doi.org/10.1134/s1027451013030270 SF ELIB - SuUB Bremen
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