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Consideration of diffuse scattering in the analysis of spec..:

Gapon, I. V. ; Petrenko, V. I. ; Avdeev, M. V....
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.  9 (2015)  2 - p. 320-325 , 2015
Link: https://doi.org/10.1134/s1027451015010073