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Improving the accuracy of the sem-eds analysis of micropart..:

Dyukov, V. G. ; Mityukhlyaev, V. B. ; Stebelkov, V. A..
Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques.  9 (2015)  5 - p. 917-922 , 2015
Link: https://doi.org/10.1134/s1027451015050055