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Computer Analysis of AFM Images of a Silicon Surface Implan..:
Sokolov, V. N.
;
Razgulina, O. V.
;
Privezentsev, V. V.
.
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 13 (2019) 4 - p. 734-739 , 2019
Link:
https://doi.org/10.1134/s1027451019040360
RT Journal T1 <Title>Computer Analysis of AFM Images of a Silicon Surface Implanted with Zinc Ions and Oxidized at Elevated Temperatures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s1027451019040360&Exemplar=1&LAN=DE A1 Sokolov, V. N. A1 Razgulina, O. V. A1 Privezentsev, V. V. A1 Ksenich, S. V. PB Pleiades Publishing Ltd YR 2019 SN 1027-4510 SN 1819-7094 JF Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques VO 13 IS 4 SP 734 OP 739 LK http://dx.doi.org/https://doi.org/10.1134/s1027451019040360 DO https://doi.org/10.1134/s1027451019040360 SF ELIB - SuUB Bremen
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