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X-Ray Reflectometry for Comparison of Structural Organizati..:
Tropin, T. V.
;
Karpets, M. L.
;
Kosiachkin, Ye.
.
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques. 15 (2021) 4 - p. 768-772 , 2021
Link:
https://doi.org/10.1134/s1027451021040224
RT Journal T1 <Title>X-Ray Reflectometry for Comparison of Structural Organization of Fullerenes C60/C70 in Polystyrene Thin Films</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s1027451021040224&Exemplar=1&LAN=DE A1 Tropin, T. V. A1 Karpets, M. L. A1 Kosiachkin, Ye. A1 Aksenov, V. L. PB Pleiades Publishing Ltd YR 2021 SN 1027-4510 SN 1819-7094 JF Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques VO 15 IS 4 SP 768 OP 772 LK http://dx.doi.org/https://doi.org/10.1134/s1027451021040224 DO https://doi.org/10.1134/s1027451021040224 SF ELIB - SuUB Bremen
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