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Analysis of reliability of semiconductor emitters with diff..:
Ivanov, A. V.
;
Kurnosov, V. D.
;
Kurnosov, K. V.
...
Technical Physics. 61 (2016) 10 - p. 1525-1530 , 2016
Link:
https://doi.org/10.1134/s1063784216100157
RT Journal T1
Analysis of reliability of semiconductor emitters with different designs of cavities
UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s1063784216100157&Exemplar=1&LAN=DE A1 Ivanov, A. V. A1 Kurnosov, V. D. A1 Kurnosov, K. V. A1 Kurnyavko, Yu. V. A1 Lobintsov, A. V. A1 Meshkov, A. S. A1 Penkin, V. N. A1 Romantsevich, V. I. A1 Uspenskii, M. B. A1 Chernov, R. V. PB Pleiades Publishing Ltd YR 2016 SN 1063-7842 SN 1090-6525 JF Technical Physics VO 61 IS 10 SP 1525 OP 1530 LK http://dx.doi.org/https://doi.org/10.1134/s1063784216100157 DO https://doi.org/10.1134/s1063784216100157 SF ELIB - SuUB Bremen
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