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Admittance of MIS Structures Based on MBE Hg1 – xCdxTe (x =..:
Voitsekhovskii, A. V.
;
Kulchitsky, N. A.
;
Nesmelov, S. N.
.
Journal of Communications Technology and Electronics. 63 (2018) 9 - p. 1112-1118 , 2018
Link:
https://doi.org/10.1134/s1064226918090231
RT Journal T1 <Title>Admittance of MIS Structures Based on MBE Hg1 – xCdxTe (x = 0.21–0.23) in a Wide Temperature Range</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s1064226918090231&Exemplar=1&LAN=DE A1 Voitsekhovskii, A. V. A1 Kulchitsky, N. A. A1 Nesmelov, S. N. A1 Dzyadukh, S. M. PB Pleiades Publishing Ltd YR 2018 SN 1064-2269 SN 1555-6557 JF Journal of Communications Technology and Electronics VO 63 IS 9 SP 1112 OP 1118 LK http://dx.doi.org/https://doi.org/10.1134/s1064226918090231 DO https://doi.org/10.1134/s1064226918090231 SF ELIB - SuUB Bremen
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