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Increasing the Accuracy of the Tunneling Microscope Measure..:
Kartashev, V. A.
;
Kartashev, V. V.
Journal of Computer and Systems Sciences International. 60 (2021) 4 - p. 610-616 , 2021
Link:
https://doi.org/10.1134/s1064230721030072
RT Journal T1 <Title>Increasing the Accuracy of the Tunneling Microscope Measurements</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1134_s1064230721030072&Exemplar=1&LAN=DE A1 Kartashev, V. A. A1 Kartashev, V. V. PB Pleiades Publishing Ltd YR 2021 SN 1064-2307 SN 1555-6530 JF Journal of Computer and Systems Sciences International VO 60 IS 4 SP 610 OP 616 LK http://dx.doi.org/https://doi.org/10.1134/s1064230721030072 DO https://doi.org/10.1134/s1064230721030072 SF ELIB - SuUB Bremen
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