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Thickness Dependence of Infrared Reflection Absorption in V..:
Maki, Kunisuke
;
Terashima, Hidenobu
;
Kikuma, Kazuhiro
Japanese Journal of Applied Physics. 29 (1990) 6A - p. L991 , 1990
Link:
https://doi.org/10.1143/jjap.29.l991
RT Journal T1
Thickness Dependence of Infrared Reflection Absorption in Vacuum-Deposited Thin Film of Polyvinylidene Fluoride
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.29.l991&Exemplar=1&LAN=DE A1 Maki, Kunisuke A1 Terashima, Hidenobu A1 Kikuma, Kazuhiro PB IOP Publishing YR 1990 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 29 IS 6A SP L991 LK http://dx.doi.org/https://doi.org/10.1143/jjap.29.l991 DO https://doi.org/10.1143/jjap.29.l991 SF ELIB - SuUB Bremen
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