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1 Ergebnisse
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Single-Event Upset Test of Static Random Access Memory Usin..:
Matsukawa, Takashi
;
Noritake, Katsunori
;
Koh, Meishoku
...
Japanese Journal of Applied Physics. 31 (1992) 12R - p. 4025 , 1992
Link:
https://doi.org/10.1143/jjap.31.4025
RT Journal T1
Single-Event Upset Test of Static Random Access Memory Using Single-Ion Microprobe
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.31.4025&Exemplar=1&LAN=DE A1 Matsukawa, Takashi A1 Noritake, Katsunori A1 Koh, Meishoku A1 Hara, Ken-ichi A1 Makoto Goto, Makoto Goto A1 Iwao Ohdomari, Iwao Ohdomari PB IOP Publishing YR 1992 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 31 IS 12R SP 4025 LK http://dx.doi.org/https://doi.org/10.1143/jjap.31.4025 DO https://doi.org/10.1143/jjap.31.4025 SF ELIB - SuUB Bremen
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