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1 Ergebnisse
1
Fracture Strength Measurement of Silicon Chips:
Lee, Seong-Min
;
Sim, Sung-Min
;
Chung, Yong-Wuk
..
Japanese Journal of Applied Physics. 36 (1997) 6R - p. 3374 , 1997
Link:
https://doi.org/10.1143/jjap.36.3374
RT Journal T1 <Title>Fracture Strength Measurement of Silicon Chips</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.36.3374&Exemplar=1&LAN=DE A1 Lee, Seong-Min A1 Sim, Sung-Min A1 Chung, Yong-Wuk A1 Young-Kwan Jang, Young-Kwan Jang A1 Hee-Kang Cho, Hee-Kang Cho PB IOP Publishing YR 1997 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 36 IS 6R SP 3374 LK http://dx.doi.org/https://doi.org/10.1143/jjap.36.3374 DO https://doi.org/10.1143/jjap.36.3374 SF ELIB - SuUB Bremen
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