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1 Ergebnisse
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Electrical Properties of Electron-Beam Exposed Silicon Diox..:
Ho Choi, Bum
;
Koo Jung, Suk
;
Il Kim, Suk
...
Japanese Journal of Applied Physics. 37 (1998) 12S - p. 6996 , 1998
Link:
https://doi.org/10.1143/jjap.37.6996
RT Journal T1 <Title>Electrical Properties of Electron-Beam Exposed Silicon Dioxidesand Their Application to Nano-devices</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.37.6996&Exemplar=1&LAN=DE A1 Ho Choi, Bum A1 Koo Jung, Suk A1 Il Kim, Suk A1 Woo Hwang, Sung A1 Ho Park, Jung A1 Kyu Kim, Yong Kim A1 Ki Min, Suk PB IOP Publishing YR 1998 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 37 IS 12S SP 6996 LK http://dx.doi.org/https://doi.org/10.1143/jjap.37.6996 DO https://doi.org/10.1143/jjap.37.6996 SF ELIB - SuUB Bremen
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