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1 Ergebnisse
1
Endurance Characteristics and Degradation Mechanism ofPolys..:
Lee, Nae-In
;
Lee, Jin-Woo
;
Han, andChul-Hi
Japanese Journal of Applied Physics. 38 (1999) 4S - p. 2215 , 1999
Link:
https://doi.org/10.1143/jjap.38.2215
RT Journal T1
Endurance Characteristics and Degradation Mechanism ofPolysilicon Thin FilmTransistor EEPROMs withElectron Cyclotron Resonance N2O-Plasma Gate Oxide
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.38.2215&Exemplar=1&LAN=DE A1 Lee, Nae-In A1 Lee, Jin-Woo A1 Han, andChul-Hi PB IOP Publishing YR 1999 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 38 IS 4S SP 2215 LK http://dx.doi.org/https://doi.org/10.1143/jjap.38.2215 DO https://doi.org/10.1143/jjap.38.2215 SF ELIB - SuUB Bremen
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